Publications
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Trust Dies in Darkness: Shedding Light on Samsung's TrustZone Keymaster Design
Alon Shakevsky, Eyal Ronen, Avishai Wool
Talks
Trust Dies in Darkness: Shedding Light on Samsung's TrustZone Keymaster Design
- August 10, 2022 Black Hat USA 2022 (30 minutes)
- April 14, 2022 Real World Crypto 2022 (20 minutes)
Awards
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Samsung Bug Bounty CVE-2021-25444, CVE-2021-25490Recognized for uncovering IV reuse vulnerabilities and keyblob downgrade attacks in Samsung's Keymaster Trusted Application.
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Pwnie Award “Best Mobile Bug” FinalistRecognized for identifying severe design flaws that allow full recovery of hardware-protected keys that were encrypted by the TrustZone on Samsung flagship devices.
Experience
2025 - Present
Ph.D. in Computer Science, UC Berkeley.
2025
Vulnerability Researcher, Wiz Research.
2018 - 2022
M.Sc. in Computer Science, Tel Aviv University,
magna cum laude.
2017 - 2022
Security Researcher, Unit 8200.
2017
Software Engineer, PTC.
2013 - 2017
B.Sc. in Mathematics and Computer Science, Tel Aviv
University.
"Beno Arbel Program for Gifted Young Students", alongside high school.
"Beno Arbel Program for Gifted Young Students", alongside high school.